The Dakota FX81-DL Bench Top Flaw Detector combines state-of-the-art flaw detection with advanced material thickness capabilities.
For further technical specifications, please see the attached datasheet.
Dakota FX81-DL Benchtop Flaw Detector (DFX-8+):
The Dakota FX81-DL Flaw Detector is designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
The time corrected gain (TCG) feature automatically compensates for sound attenuation through a material, further increasing the performance of the gauge.
Within the grid batching of the Dakota FX81-DL Flaw Detector the user has the capability to enter 'OBSTRUCT' on to the grid for easy identification of inaccessible locations to measure.
The Dakota FX81-DL Ultrasonic Flaw Detector has a 4Gb internal memory and an external memory card slot which allows up to 64Gb with full data logging via RS232 data output to DakMaster™ data management software.
Key Features:

